"pseudoprimary" meaning in English

{
  "etymology_templates": [
    {
      "args": {
        "1": "en",
        "2": "pseudo",
        "3": "primary"
      },
      "expansion": "pseudo- + primary",
      "name": "prefix"
    }
  ],
  "etymology_text": "pseudo- + primary",
  "head_templates": [
    {
      "args": {
        "1": "-"
      },
      "expansion": "pseudoprimary (not comparable)",
      "name": "en-adj"
    }
  ],
  "lang": "English",
  "lang_code": "en",
  "pos": "adj",
  "senses": [
    {
      "categories": [
        {
          "kind": "other",
          "name": "English entries with incorrect language header",
          "parents": [
            "Entries with incorrect language header",
            "Entry maintenance"
          ],
          "source": "w"
        },
        {
          "kind": "other",
          "name": "English terms prefixed with pseudo-",
          "parents": [],
          "source": "w"
        }
      ],
      "examples": [
        {
          "ref": "1988, Robert J. Feugate, Steven M. McIntyre, Introduction to VLSI Testing, page 122",
          "text": "Hitest keeps the complexity of its pattern generation under control by not allowing extensive time searches in attempts to drive fault data to and through sequential elements. Rather it treats the inputs to sequential elements as pseudoprimary outputs, and treats outputs of sequential elements as pseudoprimary inputs that are fixed for any given simulation time.",
          "type": "quotation"
        }
      ],
      "glosses": [
        "Apparently, but not actually, primary."
      ],
      "id": "en-pseudoprimary-en-adj-hY0dyUxz",
      "tags": [
        "not-comparable"
      ]
    }
  ],
  "word": "pseudoprimary"
}

{
  "etymology_templates": [
    {
      "args": {
        "1": "en",
        "2": "pseudo",
        "3": "primary"
      },
      "expansion": "pseudo- + primary",
      "name": "prefix"
    }
  ],
  "etymology_text": "pseudo- + primary",
  "head_templates": [
    {
      "args": {
        "1": "-"
      },
      "expansion": "pseudoprimary (not comparable)",
      "name": "en-adj"
    }
  ],
  "lang": "English",
  "lang_code": "en",
  "pos": "adj",
  "senses": [
    {
      "categories": [
        "English adjectives",
        "English entries with incorrect language header",
        "English lemmas",
        "English terms prefixed with pseudo-",
        "English terms with quotations",
        "English uncomparable adjectives",
        "Quotation templates to be cleaned"
      ],
      "examples": [
        {
          "ref": "1988, Robert J. Feugate, Steven M. McIntyre, Introduction to VLSI Testing, page 122",
          "text": "Hitest keeps the complexity of its pattern generation under control by not allowing extensive time searches in attempts to drive fault data to and through sequential elements. Rather it treats the inputs to sequential elements as pseudoprimary outputs, and treats outputs of sequential elements as pseudoprimary inputs that are fixed for any given simulation time.",
          "type": "quotation"
        }
      ],
      "glosses": [
        "Apparently, but not actually, primary."
      ],
      "tags": [
        "not-comparable"
      ]
    }
  ],
  "word": "pseudoprimary"
}